Analysis of Organic/High Polymer Materials

Analysis of High Polymer Materials/Polymer Composite Materials

JFE-TEC conducts structure observation of the lamination, coatability, and substrate jointing condition of coatings and composite filler/fine particles by using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), along with an analysis of fine portions in combination with EDX/EELS analysis.

The observation subjects include the following:

• Surface/structure morphology (surface texture, diplophase distribution)
• Composite particles/filler (morphology, particle size distribution, agglomeration)
• Lamination structure/coatability of surface treatment/surface modification/thin film/coating, film, crystallization, chemical bond state/molecular structure, reaction of interface between different materials, resin deterioration

• Morphological observation

  • Observation of the metallic/ceramic film on polymer substrate using ULV-SEM
  • Non-deposition observation of the polymer film/polymer substrate using ULV-SEM
  • Non-deposition observation of the deteriorated coating/filler using ULV-SEM
  • Non-deposition observation of the polymer alloy using ULV-SEM
  • Non-deposition observation/cryo-FIB processing of separator for cell using ULV-SEM
  • Observation of the organic substance attached on Si wafer using ultra low voltage SEM
  • Evaluation of fraction of material in positive electrode material (positive electrode material, binder, pore) using SEM
  • Observation of composite particles/fillers using ULV-SEM, 3D observation of fillers using FIB-SEM
  • Observation of the catalyst layer of surface of polymer substrate for electroless plating
  • SEM observation of rubber sheets having gone through cryo-FIB processing
  • Observation of the reaction layer of rubber/metallic interface using TEM
  • Observation of the polymer coating layer of metallic particles using Cs corrector STEM and TEM
  • Low-temperature observation/cryo-FIB processing of organic EL using Cs corrector STEM

• Elementary analysis

  • Analysis/cryo-CP processing of MEA for FC using FE-EPMA
  • Observation of reaction layer of rubber/metallic interface using TEM
  • Analysis of added metallic fine particles in polymer using Cs corrector STEM and TEM-EDX-EELS
  • Observation of polymer coating layer of metal particles using Cs corrector STEM/TEM-EDX-EELS
  • Low-temperature film structure analysis/cryo-FIB processing of organic EL using Cs corrector STEM-EDX-EELS
  • Observation of power generation layer (ZnO/pigment composite layer) of pigment sensitized solar cell (organic solar cell) using FIB-ULV-SEM

• Chemical state analysis

  • Identification of dispersed particles in polymer using TEM-EELS
  • Identification of resin foreign substance using Raman spectroscopy, FT-IR and NMR
  • Mass analysis of resin additive