Physical analysis
Analyses of Catalysts, Ultrafine Particles, and Nano Materials
Ultrafine particles of 100 nm or less in diameter are strongly affected by surface effects compared to bulk. In analysis of nano particles and ultrafine particle, this property is utilized.
In order that the capability of ultrafine particles by means of surface effect is fully exerted, JFE-TEC analyzes morphology, composition, diffusion state and surface chemical state of particles and undertakes structure analysis necessary for design of fine particle material or failure analysis.
Analysis of Catalyst
JFE-TEC conducts atomic- to macro-scale analysis of composition, morphology (particle diameter/shape, dispersion state, and particle size distribution), surface chemical state (oxidation, reduction, etc.), absorption, and state of dispersed particles/carrier and parent phase interface of catalyst.
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Elementary analysis
- Distribution of noble metal fine particles for vehicle combustion catalyst on carrier using Cs corrector STEM-EDX
- Analysis of noble metal fine particle surface modification layer using Cs corrector STEM-EDX
- Distribution analysis of MEA (catalytic electrode) for FC using FE-EPMA
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Morphological observation
- Atomic-scale observation of the noble metal fine particles for vehicle combustion catalyst on carrier using Cs corrector STEM
- Observation of the atomic arrangement of oxide catalyst using Cs corrector STEM
- Distribution observation of the Pt catalyst for fuel cell using ULV-SEM
- High-resolution SEM-STEM observation of the Pt catalyst (platinum catalyst)/C carrier using Cs corrector STEM
- TEM observation of the Pt catalyst
- Analysis of catalyst for electroless plating on polymer surface using Cs corrector STEM/TEM-EDX
- Distribution evaluation of catalyst for electroless plating on polymer surface using ULV-SEM-EDX
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Chemical state analysis
- Analysis of chemical state of noble metal surface using XPS
- State analysis of oxide of carrier for noble metal catalyst using EELS
Analysis of Fine Particles/Nano Particles
JFE-TEC conducts atomic- to macro-scale analysis of composition of fine particles/nano particles, morphology (particle size/shape, dispersion state/particle size distribution), surface chemical state (oxidation, reduction, etc.), surface modification/reforming, and state of dispersed particles/carrier and parent phase interface.
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Morphological observation
- Observation of the phase separation in alloy fine particles of several nm in size using Cs corrector STEM
- Observation of the core shell structure on fine particles of 10 nm in size using Cs corrector STEM
- Observation of the joining state of metallic fine particles for electrode using Cs corrector STEM
- Observation of the carbon nanotube (CNT) using Cs corrector STEM (shape, wall structure)
- Observation of the joining state of polymer-reinforced carbon nanotube (CNT) using Cs corrector STEM
- Analysis of particle diameter distribution of nano titanium, nano silver, etc. using TEM
- Observation of the fine particles for cosmetics using ULV-SEM
- Shape observation of the carbon nanotube (CNT) using ULV-SEM
- Shape observation of the carbon nanotube (CNT) formed on substrate using ULV-SEM
- Distribution observation of the oxide fine particle modification layer using ULV-SEM
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Elementary analysis
- Analysis of alloy phase in alloy fine particles of several nm in size using Cs corrector STEM-EDX
- Analysis of shell structure on fine particles of 10 nm in size using Cs corrector STEM-EDX
- Observation of the joining state of metal-reinforced carbon nanotube (CNT) using Cs corrector STEM-EDX/EELS
- ULV-SEM-EDX analysis of compound oxide glaze particles
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Crystalline structure analysis
- State analysis of carbon nanotube (CNT) using Raman spectroscopy
